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ATTC Technology Sharing丨Interpretation of the Electrical Load ISO16750-2 (2023) Standard (Part II)
2025-04-07 10:06:14

In the previous article, we partially interpreted the ISO16750-2 (2023) standard, and in this article, we will continue to talk about the methods and methods of reverse voltage, ground offset, and power supply offset tests to help us verify reliability before the product is officially mass-produced.

2. Test items

2.6 Reverse voltage

Purpose: This test examines the ability of the DUT to withstand a reverse battery connection with the use of an auxiliary starting device.

Figure 15 - Reverse Voltage - Test Case 1

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Table 16 - Reverse Voltage - Test Case 1

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Figure 16 - Reverse Voltage Test Use Case 2

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Table 17 - Reverse Voltage - Test Case 2

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Test Method:

Test case 1: Suitable for DUT used in a vehicle with a 12V nominal voltage system, where the alternator circuit is not blown and the rectifier diode is subjected to a reverse voltage of 60s. A test voltage of -4V is applied to all relevant inputs (connections) of the device under test at the same time for a duration of (60±6)s.

Test case 2: The test voltage Ureversed (see Figure 16 and Table 17) is applied to all relevant inputs (connections) of the DUT simultaneously for a duration of (60±6)s.

 

2.7 Ground offset and power supply offset

Objective: To simulate whether the function of the test piece with multiple power supply paths is in line with the design when the ground or power supply is offset.

Fig.17 Ground offset and power supply offset

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Table 18 Ground offset and power supply offset (test list of one power supply at a time)

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Test method: DUT operating mode is 3.4, all inputs and outputs should be connected to a typical load or network to simulate the in-vehicle configuration, apply US to DUT and confirm normal operation, offset should be applied to each ground/power supply line separately (see Figure 17), and should be repeated for each possible ground/power supply line combination, make a test matrix to show that the possible combination is desirable, Table 18 gives an example of such a test matrix, the bias voltage of all DUTs should be (1,0±0,1)V:

a. Apply Us to the DUT

b. The grounding/power supply line is subjected to bias voltage relative to the grounding/power supply line of the tested equipment

c. Perform functional tests under these conditions

d. Repeat steps A to C for each new ground/power line combination and repeat the reverse bias voltage test.

 

2.8 Open circuit experiment

Single-line opening

Objective: To simulate a condition in which a contact is disconnected, such as a single wire or electrical connection of a DUT, the type of interruption can be static or dynamic (poor contact), the static interrupt is simulated by test case 1, and the dynamic interrupt is simulated by test case 2

 

Test case 1

Test method: DUT operating mode is 3.4, connect and operate the DUT as expected, interrupt one circuit of the DUT/system interface, then resume the connection, observe the performance of the device during and after the interrupt.

When performing this test on a load circuit, the following conditions should also be met:

- Output on

- Output off

Repeat this step for each circuit of the device/system interface under test, and the following test conditions should be met:

- Interruption time: (10±1)s

•Open circuit resistance: ≥10MΩ

•Maximum interrupt conversion time ≤ 10ms

 

Test Case 2

Figure 18 Single-wire disconnection - test case 2

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Table 19 Single-wire disconnection - test case 2

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Test method: DUT operating mode 3.4, connecting and operating the DUT as expected, performing a series of short-term open circuit events on the DUT/system interface, then resuming the connection (see Figure 19 and Table 18), observing the device performance during and after interrupt mode. Repeating this step for each circuit of the device/system interface under test should meet the following test conditions:

•Open circuit resistance: ≥10MΩ

•Maximum interrupt conversion time ≤ 10μs

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2.9

Single-line opening

Purpose: To ensure that the DUT achieves the functional state defined in the specification when it is subjected to a rapid multi-line interrupt, for example, if the entire connector connected to the device under test is unplugged.

 

Test method: DUT operating modes 2.1 and 3.4 (i.e., test sleep mode and maximum load conditions), connect and operate the DUT as expected, interrupt the DUT connection, and then resume the connection, observe the performance of the device during and after the interrupt. For multi-connector devices, every possible connection should be tested.

 

The following test conditions should be met:

- Interruption time: (10±1)s

•Open circuit resistance: ≥10MΩ

 

2.10 Short Circuit/Overload Protection

Objective: To simulate the working conditions of short circuit and output overload of DUT

(10.1) Short circuit of signal line and load line

Test method: DUT operating mode 3.4 connects all relevant inputs and outputs (signal lines and load circuits) of the device under test to Usmax (see Tables 3 and 4) in sequence for a duration of 60 seconds ±10%, and grounded, as described in steps a) to steps f) below. Unless otherwise agreed by the customer and supplier, all other inputs and outputs remain open; perform steps a) to step f) on all signal lines/load circuits of the device under test

a) Connect the DUT signal line/load circuit to be tested to the Usmax

b) Maintain short circuit state with a duration of 60s±10%

c) Observe the behavior of the DUT during and after the holding time

d) Connect the DUT signal wire/load circuit to be tested to ground

e) Maintain a short circuit with a duration of 60s±10%

f) Observe the behavior of the DUT during and after the holding time in e).

Repeat steps a) to f) for all signal lines and load circuit inputs/outputs of the device under test.

For each of the following cases, the complete set of tests described above should be performed once:

Connecting the power supply voltage and ground terminal:

- Output on

- Output off

 

(10.2) Overload the load circuit

Test method: DUT working mode is 3.4, connect the DUT to the power supply, the load circuit should be able to operate normally.

Each load circuit should be tested individually:

-100% current capacity (nominal load)

-150% current capacity (overload)

For the test duration, the parameter specifications of the appropriate part of the ISO 8820 series (operating time rating) should be used, taking into account the upper tolerance plus 10%, and if protection other than fuses (e.g. electronic protection) is used, the test duration should be agreed by the customer and the supplier. This test is only applicable to systems/components with load circuits.

 

2.11 Withstand voltage

Purpose: To ensure the insulation withstand voltage of dielectrics. This test only requires systems/components that contain inductive components (e.g., relays, motors, wires) or connected to an inductive load circuit.

The overvoltage causes leakage current between DUT components through an electric field, which may have a negative impact on insulation performance. This test focuses on the insulation system and tests the ability of the insulating material to withstand high voltages generated by disconnecting inductive loads.

Test method: DUT working mode is 1.1 or 1.2, according to the requirements of ISO 16750-4:2023 5.6.2.2, 5.6.2.3 or 5.6.2.4, the damp heat cycling test used should be agreed by the customer and the supplier; After the damp heat cycling test, the system/component should be kept at room temperature for 0.5 hours, and the DUT should be applied 500V AC voltage (50Hz/60Hz) for 60s (other test voltages can also be accepted if the customer and supplier agree), and the applied voltage points are as follows:

•between the terminals with electrical insulation;

•Between the terminals with electrical insulation and the housing with electrically conductive surfaces;

•In the case of plastic housings, between the terminals and the electrodes that wrap the housing, such as metal foil.

 

2.12 Insulation resistance

Purpose: To ensure the minimum impedance necessary to avoid current between the DUT's insulating circuits and conductive components for verifying the insulation properties of systems and materials.

Test method: DUT working mode is 1.1 or 1.2, according to the requirements of ISO 16750-4:2023 5.6.2.2, 5.6.2.3 or 5.6.2.4, the damp heat cycling test used should be agreed by the customer and the supplier; After the damp heat cycling test, the system/component should be kept at room temperature for 0.5 hours, and the DUT should be applied 500V AC voltage (50Hz/60Hz) for 60s (other test voltages can also be accepted if the customer and supplier agree), and the applied voltage points are as follows:

•between the terminals with electrical insulation;

•Between the terminals with electrical insulation and the housing with electrically conductive surfaces;

•In the case of plastic housings, between the terminals and the electrodes that wrap the housing, such as metal foil.

Note: For special applications, the test voltage can be reduced to 100V DC if agreed by the customer and supplier.

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5. Summary

Electrical and electronic equipment in road vehicles such as automobiles is becoming increasingly complex, and its reliability is directly related to the driving safety of vehicles. By simulating extreme situations such as instantaneous power interruptions and voltage fluctuations that may be encountered in actual use, and evaluating the adaptability and durability of on-board electrical equipment, potential safety hazards in electrical equipment can be detected in advance, avoiding safety accidents such as vehicle failures and fires caused by electrical faults, and ensuring the safety of passengers and road users.

This standard provides clear and clear technical specifications and testing requirements for the road vehicle electrical and electronic equipment industry, so that manufacturers have unified standards to follow in the product design, development and production process, which helps to standardize the production behavior of the entire industry and improve the overall product quality and technical level of the industry.